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Without a robust testing strategy, defective chips reach the consumer, leading to: Brand damage.
Aiming for 99% or higher for stuck-at faults.
The ability to determine the signal value at any internal node by looking at the output pins. Key DFT Techniques for High-Quality Results
Building a high-quality digital system requires a symbiotic relationship between design and test. By integrating advanced DFT structures and leveraging sophisticated ATPG tools, companies can ensure that their silicon is not only innovative but also reliable and cost-effective. In a world where failure is expensive, testable design is the ultimate insurance policy.
Also known as JTAG, this provides a way to test the interconnects between chips on a printed circuit board without using physical probes. The Secret to a High-Quality Solution: ATPG
The ability to establish a specific logic value at any internal node.
This involves replacing standard flip-flops with "Scan Flip-Flops." When the chip is in test mode, these flip-flops form a long shift register (a scan chain), allowing testers to "shift in" test patterns and "shift out" the results.
Without a robust testing strategy, defective chips reach the consumer, leading to: Brand damage.
Aiming for 99% or higher for stuck-at faults.
The ability to determine the signal value at any internal node by looking at the output pins. Key DFT Techniques for High-Quality Results
Building a high-quality digital system requires a symbiotic relationship between design and test. By integrating advanced DFT structures and leveraging sophisticated ATPG tools, companies can ensure that their silicon is not only innovative but also reliable and cost-effective. In a world where failure is expensive, testable design is the ultimate insurance policy.
Also known as JTAG, this provides a way to test the interconnects between chips on a printed circuit board without using physical probes. The Secret to a High-Quality Solution: ATPG
The ability to establish a specific logic value at any internal node.
This involves replacing standard flip-flops with "Scan Flip-Flops." When the chip is in test mode, these flip-flops form a long shift register (a scan chain), allowing testers to "shift in" test patterns and "shift out" the results.